tender for ece lab items dept use - 1 eliminator transformer (step-down) kitinput - 220v - 240v ac, 50 hz, output-2v to 12v dc, 0-2 a ripple: 2 strain gauge trainer kitmetal foil strain gauge mounted on beam/cantilever strain measurement under applied load wheatstone bridge arrangementsignal conditioning and amplification circuitinstrumentation amplifiers, 3½ digit display of strain / output voltage zero and gain adjustment controlsprovision for applying calibrated loads regulated power supply, 230 v ac, 50 hz table-top trainer with labeled paneltest points to measure the signalsbuilt in power supplies and wooden closed cabinet supplied with patch cords and experiment manual 3 temperature measurement kitsensors: rtd (pt-100), thermocouple (fe-k/j-type), and/or thermistor (ntc).display: 3½ digit led/lcd digital display (typically 200mv fsd). temperature source: portable water kettle or heater block.signal conditioning: on-board circuitry for amplification, linearization, and cold junction compensation.test points: multiple 2mm/4mm banana sockets for monitoring input/output signals.power supply: 230v ac, 50hz, single-phase.accessories: includes a glass thermometer, ntc thermistor probe 10k, k-type thermocouple probe, patch cords, and instruction manual. 4 sim reader trainer kitsim compatibility supports 2g 3g 4g lte sim cards,sim reader mode: reading writing gsm sim card data, imsi, ki codes, phonebook interface usb 2.0 or rs 232 serial port for pc communication.clock frequencies: selectable frequencies 3.579 mhz, 7.159 mhz, 14.318 mhz for sim card operation.power supply: onboard smps 12v 2a or 5v dc with overload protection. hardware components:6-pin or 8 pin sim card socket.led indicators for power, sim reset, and data activity.optional lcd 128x64 and keypad 20 keys for standalone operation. software tools support for at commands gsm etsi 07.0707.05, sim manager utilities, and data logger functionality. common trainer kit featuresfault simulation ability to create faults e.g., sim not detected, vcc failure for troubleshooting.test points: multiple test points e.g., 55 nos for observing signals sim rst, clk, i o via oscilloscope.construction tested glass epoxy pcb, often housed in a study educational case. = limited