Supply Of Cantilever Probes And Calibration Grating For Existing Scanning Probe Microscope :- Semi-Contact Silicon Probe With Tin Coating Specifications: (1) Chip Size: 1.6X3.4X0.4 Mm Approximately, (2) Reflective Side Coating: Au, No. Of Cantilever: 1 R
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Supply Of Cantilever Probes And Calibration Grating For Existing Scanning Probe Microscope :- Semi-Contact Silicon Probe With Tin Coating Specifications: (1) Chip Size: 1.6X3.4X0.4 Mm Approximately, (2) Reflective Side Coating: Au, No. Of Cantilever: 1 Rectangular (3) Cantilevers Length: Typically 125 +/-20 Um, (4) Cantilever Width: 40Um +/-5, (5) Cantilever Thickness: 4 +/-1 Um, (6) Resonant Frequency: 220-450 Khz, (7) Typical Force Constant: 40-100 N/M, (8) Aspect Ratio: 3:1-7:1, (9) Tip Cone Angle:
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