Tender For Supply, Installation, Testing, Commissioning And Training Of Table-Top X-Ray Diffractometer (Xrd) System At Department Of Physics, Savitribai Phule Pune University, Pune, 411007, Maharashtra, India.
Tender Overview
Project Description
Tender for Supply, Installation, Testing, Commissioning And Training Of Table-Top X-Ray Diffractometer (Xrd) System At Department Of Physics, Savitribai Phule Pune University, Pune, 411007, Maharashtra, India. , Supply, Installation, Testing, Commissioning And Training Of Table-Top X-Ray Diffractometer (Xrd) System As Per The Following Specifications. Including Applying For And Obtaining Necesaary Licenses From Authorities ( Government Fees Will Be Paid By The University If Any). Technical Specifications:- 1. General Requirements:-Table-Top X-Ray Diffractometer For Research Applications, Suitable For Analysis Of:-Powder Samples, Bulk Materials And Alloys, Thin Films (Optional), Capable Of:- Phase Identification, Quantitative Phase Analysis, Structural Analysis. 2. X-Ray Source:- Cu Kα Sealed X-Ray Tube, Power: ≥ 600 W, Voltage: Up To ~ 40 Kv (Variable), Current: ≥ 15 Ma (Variable), Output Stability: ≤ ± 0.1%, Automatic Shutter And Safety Interlocks. 3. Goniometer:- Geometry: Θ-2Θ (Bragg-Brentano), 2Θ Range: Minimum 5° To ≥140°, Step Size: ≤ 0.02°, Angular Accuracy: ≤ ±0.02°, Fixed Or Variable Divergence Slit With Suitable Optics, Capability For Low-Angle (≤ 5° 2Θ) Measurements (Optional ), Provision For Thin Film/Grazing Incidence Attachment (Optional). 4. Detector System:-Solid-State Detector (1D Strip / Position-Sensitive Detector),Count Rate ≥ 1 × 105 Cps,Fast Scan ≥ 10°/Min,Resolution Contribution: ≤ 0.02°,Built-In Fluorescence Suppression, Suitable For Time-Resolved Measurements. 5. Sample Handling:-Sample Holders For Powder And Bulk Materials, Low-Background Sample Holder (Optional), Multi-Sample Changer: ≥ 6 Samples (Optional), Provision For Thin Film Sample Mounting (Optional) 6. Temperature Capability:- High-Temperature Stage: Room Temperature To ≥ 800°C (Optional), Programmable Temperature Control 7. Software & Data Analysis:- Integrated Control And Analysis Software (Oem Supplied) , Real-Time Data Acquisition And Visualisation, Data Processing: Peak Search, Background Subtraction, Smoothing And Kα₂ Stripping, Peak Fitting / Smoothing, Analysis Capabilities: Phase Identification, Quantitative Analysis, Rietveld Refinement, Lattice Parameter/Crystallinity Analysis. 8. Diffraction Database:- Licensed Diffraction Database (Pdf-2 / Pdf-4) From International Centre For Diffraction Data (Icdd) (Optional). 9. Computer & Accessories:- Suitable Computer System With The Latest Os, Ups Backup, Essential Accessories And Calibration Standards. 10. Installation & Training:- Supply, Installation, And Commissioning At The Site, User Training, Operation Manuals. 11. Warranty & Support:- Minimum 3-Year Comprehensive Warranty, Service Support Availability In India.
BOQ
| Sl. No. | Item Description |
| 1 | SUPPLY, INSTALLATION, TESTING, COMMISSIONING and TRAINING of TABLE-TOP X-RAY DIFFRACTOMETER (XRD) SYSTEM as per the following specifications. including applying for and obtaining necesaary licenses from authorities ( Government fees will be paid by the university if any). Technical Specifications:-1. General Requirements:-Table-top X-ray Diffractometer for research applications, Suitable for analysis of:-Powder samples, Bulk materials and alloys, Thin films (optional), capable of:- Phase identification, Quantitative phase analysis, Structural analysis. 2. X-Ray Source:- Cu Kα sealed X-ray tube, Power: ≥ 600 W, Voltage: up to ~ 40 kV (variable), Current: ≥ 15 mA (variable), Output stability: ≤ ± 0.1%, Automatic shutter and safety interlocks. 3. Goniometer:- Geometry: θ–2θ (Bragg-Brentano), 2θ range: minimum 5° to ≥140°, Step size: ≤ 0.02°, Angular accuracy: ≤ ±0.02°, Fixed or variable divergence slit with suitable optics, Capability for low-angle (≤ 5° 2θ) measurements (optional ), Provision for thin film/grazing incidence attachment (optional).4. Detector System:-Solid-state detector (1D strip / position-sensitive detector),Count rate ≥ 1 × 105 cps,Fast scan ≥ 10°/min,Resolution contribution: ≤ 0.02°,Built-in fluorescence suppression, Suitable for time-resolved measurements. 5. Sample Handling:-Sample holders for powder and bulk materials, Low-background sample holder (Optional), Multi-sample changer: ≥ 6 samples (Optional), Provision for thin film sample mounting (optional)6. Temperature Capability:- High-temperature stage: Room temperature to ≥ 800°C (optional), Programmable temperature control7. Software & Data Analysis:- Integrated control and analysis software (OEM supplied) , Real-time data acquisition and visualisation, Data processing: Peak search, Background subtraction, Smoothing and Kα₂ stripping, Peak fitting / smoothing, Analysis capabilities: Phase identification, Quantitative analysis, Rietveld refinement, Lattice parameter/crystallinity analysis. 8. Diffraction Database:- Licensed diffraction database (PDF-2 / PDF-4) from International Centre for Diffraction Data (ICDD) (Optional).9. Computer & Accessories:- Suitable computer system with the latest OS, UPS backup, Essential accessories and calibration standards. 10. Installation & Training:- Supply, installation, and commissioning at the site, User training, Operation manuals. 11. Warranty & Support:- Minimum 3-year comprehensive warranty, Service support availability in India. Please Enable Macros to View BoQ information |
AI Tender Summary
Tender Timeline
Tender Published
Tender notice published.
CompletedBid Submission Deadline
Online submission via eProcurement portal.
Upcoming · 25 daysBid Opening Date
Technical bids will be opened and evaluated.
Upcoming · 28 daysTender Documents
Download All (ZIP) ↓We takes all possible care for accurate & authentic tender information. However users are requested to refer Original source of Tender Notice / Tender Document published by Tender Issuing Agency before taking any call regarding this tender