Cantilever Probes And Calibration Grating For Existing Scanning Probe Microscope :- Semi-Contact Silicon Probe With Tin Coating Specifications: (1) Chip Size: 1.6X3.4X0.4 Mm Approximately, (2) Reflective Side Coating: Au, No. Of Cantilever: 1 Rectangular
Tender Value
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Estimated cost
Bid Submission
03 Mar 2014
0 days left
EMD
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Bank guarantee accepted
Document Fee
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Non-refundable
Tender Type
Online
Tender Overview
Organization
Tender ID
Competition Type
NCB
Bidding Type
Tender
Location / State
Hyderabad → Maharashtra
EMD Exemption
Not Available
Quantity
Not Available
Website
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Address
Project Description
Cantilever Probes And Calibration Grating For Existing Scanning Probe Microscope :- Semi-Contact Silicon Probe With Tin Coating Specifications: (1) Chip Size: 1.6X3.4X0.4 Mm Approximately, (2) Reflective Side Coating: Au, No. Of Cantilever: 1 Rectangular (3) Cantilevers Length: Typically 125 +/-20 Um, (4) Cantilever Width: 40Um +/-5, (5) Cantilever Thickness: 4 +/-1 Um, (6) Resonant Frequency: 220-450 Khz, (7) Typical Force Constant: 40-100 N/M, (8) Aspect Ratio: 3:1-7:1, (9) Tip Cone Angle:
AI Tender Summary
Tender Timeline
Feb 05, 2014
11:30 IST
Tender Published
Tender notice published.
CompletedMar 03, 2014
17:00 IST
Bid Submission Deadline
Online submission via eProcurement portal.
CompletedMar 06, 2014
Bid Opening Date
Technical bids will be opened and evaluated.
Completed