}

Bids Are Invited For Atomic Force Microscope (Afm) , Nano Indenter , Micro Hardness Tester , X-Ray Diffraction (Xrd) , Optical Profiler , Confocal Microscope , Raman Microscope , Spectroscopic Ellipsometer , Fourier - Transform Infrared Spectroscopy(, Bangalore-Karnataka

Department Of Defence Research And Development has published Bids Are Invited For Atomic Force Microscope (Afm) , Nano Indenter , Micro Hardness Tester , X-Ray Diffraction (Xrd) , Optical Profiler , Confocal Microscope , Raman Microscope , Spectroscopic Ellipsometer , Fourier - Transform Infrared Spectroscopy(. Submission Date for this Tender is 25-08-2025. Hardness Testers Tenders in Bangalore Karnataka. Bidders can get complete Tender details and download the document.




Tender Notice

50500719
Bids Are Invited For Atomic Force Microscope (Afm) , Nano Indenter , Micro Hardness Tester , X-Ray Diffraction (Xrd) , Optical Profiler , Confocal Microscope , Raman Microscope , Spectroscopic Ellipsometer , Fourier - Transform Infrared Spectroscopy(
Tender
Indian
Karnataka
Bangalore
25-08-2025

Tender Details

Bids Are Invited For Atomic Force Microscope (Afm) , Nano Indenter , Micro Hardness Tester , X-Ray Diffraction (Xrd) , Optical Profiler , Confocal Microscope , Raman Microscope , Spectroscopic Ellipsometer , Fourier - Transform Infrared Spectroscopy( Ftir) , Energy Dispersive Spectrometry (Edx) & Electron Backscattered Diffraction (Ebsd) , Co-Ordinate Measuring Machine (Cmm) , Form Tester , Stereo Microscopy , Sample Preparation , Surface Roughness Tester (Contact Type) , Portable Surface Roughness Tester Total Quantity : 1600

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