Indian Institute Of Technology-IITB has published Tender For Supply Of Materials Processing Lab (Mpl) Equipment At Iit Madras. Submission Date for this Tender is 18-03-2024. Micrometer Tenders in madras Tamil Nadu. Bidders can get complete Tender details and download the document.
Sl. No. | Item Description |
1 | SUPPLY OF MATERIALS PROCESSING LAB EQUIPMENT AT IIT MADRAS (As per technical specification in Annexure-A): |
2 | PARTICLE SIZE ANALYSER WITH RANGE OF 0.3 NANOMETER TO 10 MICROMETER (As per technical specification in Annexure-A) |
3 | PARTICLE SIZE ANALYSER WITH RANGE OF 0.02 MICROMETER TO 2000 MICROMETER OR BETTER (As per technical specification in Annexure-A) |
4 | MULTIPOINT BET SURFACE AREA ANALYSER SYSTEM (As per technical specification in Annexure-A) |
5 | METAL POWDER TAP DENSITY MEASUREMENT SYSTEM (As per technical specification in Annexure-A) |
6 | METAL POWDER FLOW RATE MEASUREMENT SYSTEM USING THE HALL FLOWMETER FUNNEL (As per technical specification in Annexure-A) |
7 | OPTIONAL EXTENDED WARRANTY FOR 3 YEARS AFTER STANDARD WARRANTY |
8 | PARTICLE SIZE ANALYSER WITH RANGE OF 0.3 NANOMETER TO 10 MICROMETER – 1 No. (As per technical specification in Annexure-A) |
9 | 3rd Year |
10 | 4th Year |
11 | 5thYear |
12 | PARTICLE SIZE ANALYSER WITH RANGE OF 0.02 MICROMETER TO 2000 MICROMETER OR BETTER – 1 No.(As per technical specification in Annexure-A) |
13 | 3rd Year |
14 | 4th Year |
15 | 5thYear |
16 | MULTIPOINT BET SURFACE AREA ANALYSER SYSTEM- 1 No. (As per technical specification in Annexure-A) |
17 | 3rd Year |
18 | 4th Year |
19 | 5thYear |
20 | METAL POWDER TAP DENSITY MEASUREMENT SYSTEM- 1 No. (As per technical specification in Annexure-A) |
21 | 3rd Year |
22 | 4th Year |
23 | 5thYear |
24 | METAL POWDER FLOW RATE MEASUREMENT SYSTEM USING THE HALL FLOWMETER FUNNEL – 1 No. (As per technical specification in Annexure-A) |
25 | 3rd Year |
26 | 4th Year |
27 | 5thYear |
28 | OPTIONAL AMC OF THE EQUIPMENT FOR A PERIOD OF 2 YEARS AFTER THE EXTENDED WARRANTY |
29 | PARTICLE SIZE ANALYSER WITH RANGE OF 0.3 NANOMETER TO 10 MICROMETER (As per technical specification in Annexure-A) |
30 | 6th year |
31 | 7th year |
32 | PARTICLE SIZE ANALYSER WITH RANGE OF 0.02 MICROMETER TO 2000 MICROMETER OR BETTER (As per technical specification in Annexure-A) |
33 | 6th year |
34 | 7th year |
35 | MULTIPOINT BET SURFACE AREA ANALYSER SYSTEM- 1 No. (As per technical specification in Annexure-A) |
36 | 6th year |
37 | 7th year |
38 | METAL POWDER TAP DENSITY MEASUREMENT SYSTEM- 1 No. (As per technical specification in Annexure-A) |
39 | 6th year |
40 | 7th year |
41 | METAL POWDER FLOW RATE MEASUREMENT SYSTEM USING THE HALL FLOWMETER FUNNEL – 1 No. (As per technical specification in Annexure-A) |
42 | 6th year |
43 | 7th year |
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