AFM Probes for contact mode compatible with NT-MDT Solver Pro ECAFM: Length (µm): Min 215, Typical 225, Max 235 µm Width (µm): Min 25, Typical 30, Max 35 µm Thickness (µm): Min 0.5, Typical 1.0, Max 1.5 µm Force constant (N/m): Min - 0.01, Typical 0.11, Max - 0.5 N/m Resonant frequency (kHz): Min 8, Typical 22, Max 39kHz Tip Characteristics: - should be compatible with SPM devices - should have standard sizes (1.6 x 3.4 mm) and thickness (0.3 mm) of cantilever chip - should have Au high reflectivity coating - should have aspect ratio 3:1 – 5:1 - typical curvature radius of the tip should be 10 nm. - tip height should be 14-16 µm. Silicon Cantilever: - should include 1 straight spring and thickness of the chip should be 0.3 mm
2
AFM Probes for contact mode compatible with NT-MDT Solver Pro ECAFM: Length (µm): Min 215, Typical 225, Max 235 µm Width (µm): Min 25, Typical 30, Max 35 µm Thickness (µm): Min 0.5, Typical 1.0, Max 1.5 µm Force constant (N/m): Min - 0.01, Typical 0.11, Max - 0.5 N/m Resonant frequency (kHz): Min 8, Typical 22, Max 39kHz Tip Characteristics: - should be compatible with SPM devices - should have standard sizes (1.6 x 3.4 mm) and thickness (0.3 mm) of cantilever chip - should have Au high reflectivity coating - should have aspect ratio 3:1 – 5:1 - typical curvature radius of the tip should be 10 nm. - tip height should be 14-16 µm. Silicon Cantilever: - should include 1 straight spring and thickness of the chip should be 0.3 mm
3
Polycrystalline sapphire substrates of dimension 19 mm x 24 mm compatible with NT-MDT Solver Pro ECAFM substrate holder
4
Polycrystalline sapphire substrate of dimension 19 x 19 mm that can hold large samples up to 40 x 40 mm compatible with NT-MDT Solver Pro ECAFM
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