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Supply of Stand alone semiconductor characterization unit with software to integrate into the already existing source measuring units for carrying-out C-V characterization, I-V characterization for semiconductor devices and I-V characterization for photoconductivity measurements for solar cell devices. On integration with the existing unit with the basic software, the integrated system must become a dedicated unit set up for C-V and I-V systems,Xenon Arc Lamp having 1500w with housing and with complete voltage source,Zeeman Effect Apparatus,studying the Zeeman Effect and realise the splitting of spectral lines under an applied magnetic field consisting of the following :High Power electromagnet with power supply,Gauss meter along with sensor,Mercury lamp,Mounted filters and polarisers,Fabry perot etalon,CCD camera and software,Rail and carriage based mechanical mounts for all optics,Michelson Interferometer to determine the refractive index of a gas/air using a laser,Faraday Effect Apparatus for studying the optical activity in a homogenous medium under the application of an external magnetic field. The rotation of plane polarisation is to be detected very precisely under an applied magnetic field,Dual Phase DSP Lock-in Amplifier for operating over a frequency range of 1 mHz to 250 kHz or more with full scale voltage sensitivities down to 2nV or less and current sensitivities to 2 fA or less. The unit should have a choice of operating modes, signal recovery or vector voltmeter, for optimum measurement accuracy under different conditions.