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Eoi For Supply Of Listed Items, MMD, IIT Bombay-Maharashtra

Indian Institute Of Technology-IITB has published Eoi For Supply Of Listed Items. Submission Date for this Tender is 11-01-2021. Cutting Crimping and Punching Tools Tenders in MMD, IIT Bombay Maharashtra. Bidders can get complete Tender details and download the document.




Tender Notice

26298875
Corrigendum : Eoi For Supply Of Listed Items
Open Tender
Indian
Maharashtra
MMD, IIT Bombay
11-01-2021

Tender Details

Eoi For Supply Of Listed Items - A Precision Diamond Scriber For Wafer Scribing A 8-Channel Arbitrary Waveform Generator, With Sampling Rate Of Minimum 1 Gsa / S Fourier Transform Infrared Spectroscope Contact Angle Meter / Optical Tensiometer Potentiostat / Electrochemical System With Eqcm Thermal Analysis Of Materials Tga And Dsc N2 Plasma Cells And Its Accessories Cryogen-Free Dilution Refrigerator Aerobic / Anaerobic Respirometer System Combined Wireless Fnirs And Wireless Eeg System T2sl Epi Wafer - Mwir Ultrafast Ti:Sapphire Amplifier Mixed Signal Oscilloscope Optical Table, Hybrid Damped Smarttable Solid State Femtosecond Laser With Dpss Pump Laser Gas Chromatography Mass Spectrometr Gcms Stopped-Flow Fluorescence Spectrometer Fully Automated Robotic Workstation Magnetic Property Measuring System ( Mpms Atomic Force Microscopy ( Afm ) Microwave Synthesizer 1.5 Scanning Mobility Particle Sizer Optical Particle Sizer, Dusttrak Drx Aerosol Monitor And Aerosol Neutralizer For Smps Beta Attenuation Monitor: Portable Bam Cross Beam / Dual Beam With Laser Attachment Vector Signal Generator High-Pressure Temperature-Controlled Direct Shear And Triaxial System Optical Spectrum Analyser Rotary Evaporator System Next Generation Sequencing ( Ngs ) Platform Highly Sensitive Potentiostat / Galvanostat Glyconeer 2.1 Automated Oligosaccharide Synthesizer High Voltage Nanosecond Pulse Electric Field Generator Scmos Sensor Based Monochrome Camera Non-Contact Metrology System Optical 3D Coordinate Measurement Machine ( Cmm ) Contact-Type Profilometer Factsage Thermodynamic Software Glow Discharge Optical Emission Spectroscope Integrated Infra-Red Based Nanoscale Atomic Force Microscope Ecvt Multiphase Flow System Xrd-Mill Mccrone Cdte X-Ray Soft And Hard Detector Analytical Ultra Centrifuge Multi-Cultivator For Cultivation Of Photosynthetic Organisms Particle Size Analyzer Single Tilt Heating Holder Tem Based Local Orientation And Strain Carbonaceous Aerosol Speciation System ( Cass ) Micro Ct And Optical Imaging For Animal Imaging Facility Multiphoton Imaging Equipment For Live Animal Imaging Cryofree 9 Tesla Superconducting Magnet Nmr Spectrometer For Solids High-Throughput Imaging System Ultramicrotome Lattice Light Sheet Microscope Multi Angle Dynamic Light Scattering ( Mals ) System Thermal Conductivity Measurement Aberration Corrected Tem System For Soft Materials With Cryo Capability. Raman Spectrometer Close-Cycle Cryostat Field-Emission Scanning Electron Microscope Polymer Processing Facility Consisting Of Bench Top Lab-Scale Twin Screw Extruder With Mini Injection Moulding Machine And Accessories Differential Interference Contrast ( Dic ) Reflected Light Optical Microscope. Benchtop Stylus Profilometer External Pattern Generating System Preparative Hplc Gpc Hplc Gel Scanner Optical Tweezers Spectrofluorimeter Cryogen-Free Physical Property Measurement System ( Ppms ) Tlc-Masss Bench-Top Equipment React Ir In Situ Ft-Ir Spectroscopy Instrument Atr-Ftir Spectrophotometer Benchtop 3D Bioprinters Highperformancecomputingcluster ( Hpcc ) Space Time3 Ferroelectric Characterization Unit Contact-Type Profilometer Gel Scanner With Fluorescence Solid State Nmr ( Ss-Nmr ) Spectrometer Operating At 400 Mhz Microbalance System For Weighing The Samples Accurately Microwave Synthesis System With Magnetic Stirring At Both Low And High Temperatures At High Pressures. Dynamic Light Scattering With Zeta Potential Set-Up Gas-Chromatography Equipped With Mass-Spectrometry With Autoinjector Melting Point Apparatus For Parallel Boiling Point Detection System Tg-Dta / Photoionization Mass Spectrometer And Dsc With Capabilities Power Device Characterization System ( Pdcs Semi-Preparative Liquid Chromatography System ( Hplc ) For Automated Purification Equipped With A Photo Array Detector, Automated Injection And Fraction Collection And Columns Spectrofluorometer With Capabilities Of A Continuous 150W Ozone-Free Xenon Source Delivering Excitation Light From 230Nm To The Nir, Nir Detector ( 800Nm-1550Nm ) , Liquid Cuvette, Solid Sample Holder, Peltier Accessory, Bandpass Filters And Adapter And Stopped Flow Accessory. Uv-Visible Spectrophotometers With Capabilities: Wavelength Range : 185 Nm – 3300 Nm; 0.1 Nm Resolution, Double Beam Photometric System, Double Monochromator Grating And Integrating Sphere Attachment. Super Micro Black Cell, Film Holder And Powdered Sample Holder For Integrating Shpere. Solution State Nmr Spectrometer Operating At 600 Mhz Frequency Having Minimum Three Channels With Capabilities Of Recoding Multiple Nuclei Ss-Nmr ( Broadband Probe ) , And Multi-Dimensional 2D And 3D Nmr Measurements With Operating Temperature Range Of -20 Oc - +80 Oc ( 3-Channel Probe For Proton Detection And 15N / 13C Decoupling ) . High Purity Ingots Of Aluminium, Arsenic, Beryllium, Gallium, Indium, Antimonide – Source Materials For Molecular Beam Epitaxy System Arbitrary Waveform Generator Time Correlation Counter For Single Photons Gas And Solvent ( Vapour ) Sorption Analyser High Purity Nitrogen Gas Generator, ( 99.9995% Purity, Co2 / Co <1 Ppm ) With Flow Rate Of 10L / Mi High-Performance Computing ( Hpc ) Facility With Online Ups, Networking Switch, And Software. Isothermal Titration Microcalorimeter Cameras And Accessories For Motion Capture System 3-D Printer For Cement Concrete Refrigerated Incubator Shaker Multi Mode Reader With Accessories Tetrad Dissection Microscope High Performance Electron Beam Lithography System For Advanced Nanolithography. Dual Chamber Sputtering System Reactive Ion Etching ( Rie ) Based Inductively Coupled Plasma ( Icp ) Source System Is Required. Plasma Processing System Oxygen / Nitrogen Elemental Analyzer. Laser For Single And Two Photon Ceramic Microstereolithography Constant-Rate-Strain ( Crs ) Thermal Consolidation Apparatus Time Corelated Single Photon Counter ( Tcspc ) System Is An Upgradation Of An Existing Photoluminescence Spectroscopy System Which Is Capable Of Steady State Measurements Only. With Tcspc System, Fluorescence Lifetime Can Be Measured With The Temporal Resolution Of 50-100Ps. Measurement Time Window Is 65Ns- 250Ms. Tcspc Uv / Vis Detector Has A Spectral Range Of 220-650Nm. Source Wavelength Range Is 300-800 Nm. Count Depth Is 106 Counts Per Readout. Deep Reactive Ion Etching ( Drie ) System For Etching Silicon Carbide Substrate Used In The Fabrication Of High Electron Mobility Transistors ( Hemts ) . The System Comes With Gas Lines And Mfcs ( Cl2, Ar, O2, Sf6, Bcl3 And Cf4 ) , Separate Reaction And Load Lock Chamber ( Rc & Ll ) With Highly Efficient Separate Vacuum Systems For Each, Plasma Generator Power / Bias Rating Of 1 Kw / 300 W With A Max. Power Upgrade Of 600 W Delivering A Significantly High Etch Rates For Sic Providing Sharp Edge Contours. Digital Processing Confocal Scanning Violet Laser Microscope With Ultra-High Temperature Infrared Heating Furnace System. A Network-Attached Storage Facility With High Storage Space, Server To Host, Necessary Backup / Raid Tools, And Ups. X-Ray Photoelectron Spectroscopy ( Xps ) Upgrades Of Existing Versaprobe Ii System From Physical Electronics Usa Consisting Of Leips ( Low Energy Inverse Photoelectron Spectroscopy ) With Filters, Scanning Auger Spectroscopy, Various Sample Holders Capable Of High Temperature And Sample Bias, Pressure Gauge, Vacuum Transfer Vessel And New Analysis Software. 1 ) Basic Plasma Cleaner Capable Of Bonding Glass-Pdms Or Pdms-Pdms For Fabrication Of Microfluidic Application. It Should Also Be Able To Activate And Sterile Pdms A Multi-Material 200 Mm Atomic Layer Deposition System Capable Of Depositing Various Oxides, Nitrides, And Metals Using Thermal As Well As Plasma-Assisted Processes, Low Vapour Pressure ( 0.01 Torr ) Precursors, Ozone, At Temperatures Upto 500 C, With Load-Lock, In-Situ Thin Film Analysis Capability, Software And Vacuum Pump. A 200 Mm Surface Profilometer With Motorized X / Y Stage, 4 A Step-Height Repeatability, As Well As Stitching, 3D Mapping And 2D Stress Measurement Capabilities In Automated Fashion. Table Top Precision Lithography Tool With Raster Scan And Vector Scanning Capabilities. The System Must Have The Capability Of Lithographic Writing As Well As Maskless Or Direct Writing Of Patterns On Samples It Is A High Power High Heat Based Plasma System For Photoresist Ashing. Strong Ashing Rate Of 24Nm / S Is Needed. Standalone Rapid Thermal Processing ( Rtp ) System With Vertical Configuration For Reduced Foot-Print, Cold Wall Process Chamber With At-Least 100 Mm Wafer Capability, Fully Automated Anechoic Chamber Till 110 Ghz For 5G And Higher Standards Multi-Phase Realative Permeability Rig Multimode Microplate Reader ( With Absorbance, Fluorescence And Luminescence Measurement Capability ) Ceramic 3D Printer System Super Resolution ( Sr ) Microscope Imaging Platform. Cubic Immersive Virtual Reality System 80 Ult Freezer Fplc ( Fast Protein Liquid Chromatography ) System For Separation Of Biomolecules Refrigerated Centrifuge Refrigerated Orbital Shaker Digital Slope Inclinometer System Vibrating Wire Transducer Based Contact Type Earth Pressure Sensors Lab Oc-Ec Aerosol Analyzer Flight Simulator Software In-Loop Simulation ( Sils ) Facility Gas Turbine Engine With Instrumentation Nanoparticle Tracking Analyzer Atomic Emission Spectrometer ( Icp-Aes ) Tap-Kpc ( Temporal Analysis Of Products – Kinetic Processing And Characterisation ) Multi-Experiment System Wide Angle X-Ray Diffractometer With High Temperature And Electrochemical Minivol Tas Pm2.5 And Pm10 Sampler, Test Electronics Mainframe, Upto 8 Slots, Automated Data Acquisition And Test Software Thermal Conductivity / Diffusivity Measurement Apparatus Gravimetric Fuel Flow Meter Core Saturator Is Used To Saturate Completely Vacuumed Solid Core Samples By Injecting Co2 / N2 / Ch4 Gases And Oil / Water / Brine Liquid Phases At Variable Pressure As Per Requirement. Helium Porosimeter Can Measure The Porosity And Density Of Solid Core Samples By Saturating The Cores With Helium Through Isothermal Expansion. Drill Press Is Used To Cut Core Samples Of Variable Length And Diameter From Blocks Of Geomaterials / Building Materials. Core Samples Are Extracted Using Diamond Mounted Motorized Drill Bits With Hand Operated Lifting Mechanism. Trim Saw With End Face Grinder Is Used Forprecision Cutting And Smooth, Parallel Face Preparation Of Rock Samples And Concrete Using Motorized Low Vibration Diamond Mounted Blades. The Flash Differential Scanning Calorimetry ( Flash Dsc Chip Nanocalorimetry ) Revolutionizes Rapid-Scanning Dsc. The Instrument Can Analyse Reorganization Processes That Were Previously Impossible To Measure. The Flash Dsc Is Way Superior To Conventional Dsc With Heating And Cooling Rates ( K / S ) That Cover A Range Of More Than 7 Decades. Moreover, To The Best Of Our Knowledge This Unique Instrument Is Going To Be The First Of Its Kind In The Country Till Date. Test Electronics Power, Analog, Digital Cards For The Mainframe, Upto 8 Slots Compatible To Automated Data Acquisition And Test Software Test Dewar, 2Stage Closed Cycle Water Cooled Compressor, With 100 Pin Chip Carrier And Filter Assembly Kit And Controller Reactithermm With Accessories Hplc With Diode Array Detector And Fluorescence Detector Portable Raman Spectrometer Ultra Precision Machining ( Upm ) System Additive Subtractive ( Hybrid ) Manufacturing System For Metals And Accessories. Electron Beam Additive Machine High-Frequency Fatigue System And Accessories. Transient Absorption Spectrometer System Stopped Flow Spectrometer Multi Mode Microplate Reader Wedge Type Heat Sealing Machine

Corrigendum Details

Sr No CorrigendumDate Corrignedum CorrigendumType NewSubmissionDate
1 23-Dec-2020 Corrigendum I Other 01-01-2021
2 30-Dec-2020 Extension of due date Date 11-01-2021

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