Transmission Electron Microscope - Auiration Corrected Transmission Electron Microscope. A Double Aberration -Corrected Transmission Electron Microscope With A Corrector In The Jet -Shaping Optics And Another For The Imaging System Is Required. The Device Must Be Designed And Adjusted For Operation With Acceleration Voltages Of 300 Kv, 200 Kv And At Least 80 Kv Or 60 Kv. It Must Have At Least Two Detectors For The Energy Spectroscopy And An Electron Energy Loss Spectrometer With Energy Filter Function. In Addition, Highly Sensitive And Fast Cameras And Detectors Are Required To Optimally Absorb The Signals In The Different Operating Modes Of The Instrument (Tem, Stem, Diffraction, Eftem, Eels, 4D Stem, Etc.). A Detailed Description Of The Service Description And The Surcharge Criteria Can Be Found In Appendix 3.
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