Tenders Are Invited For Electron Microscopes – Fib / Tem Ga Focused Ion Beam Instrument And Transmission Electron Microscope

Electron Microscopes – Fib / Tem Ga Focused Ion Beam Instrument And Transmission Electron Microscope. The Two Instruments Shall Warrant A Smooth Workflow For Tem Sample Preparation By Fib And State-Of-The-Art Sample Characterization By Analytical, High-Resolution Tem/Stem, Particularly, But Not Exclusively. A Broad Spectrum Of Materials Science Samples Shall Be Addressed, Including Highly Fragile And Beam-Sensitive Samples Such As, E.G., Li-Based Thin-Film Battery Materials, Carbon-Based Nanomaterials Or Zeolites For Catalytic Applications. Energy Dispersive X-Ray (Edx) Analytics Is Required On Both Instruments, Special Acquisition Modes In Stem Are Desirable, Namely 4D-Stem In Combination With The Tem Camera, And A Segmented Detector For Differential Phase Contrast Stem. Besides Tem Sample Preparation, The Fib Instrument Shall Be Employed For 3D Imaging By Consecutively Ion-Beam Milling And Imaging. To Warrant Smooth And Efficient Operation Of These Multi-User Instruments, An Important Aspect Lies On Automatic Or Semi-Automatic Routines, Particularly Concerning Materials Processing By Fib.