GTR 96171617
Tenders are invited for Focused Ion Beam Scanning Electron Microscope System For Sample Preparation For Atom Probe Tomography
ICB — International Competitive Bid
Closed
Eastern Europe
Tender Information
GTR Reference
96171617
Tendering Authority
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Financer Name
Self-Funded
Work Title
Tenders are invited for Focused Ion Beam Scanning Electron Microscope System For Sample Preparation For Atom Probe Tomography
Bid Type
ICB — International Competitive Bid
Country
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Geographical Region
Eastern Europe
Political Region
European Union
Last Date of Bid Submission
03-06-2025
Closed
Work Detail
Tenders are invited for Focused Ion Beam Scanning Electron Microscope System For Sample Preparation For Atom Probe Tomography 38511000-0 - Electron Microscopes
Key Value
Tender Value
Ref. Document
Tender Documents
Global Tender Document
58386e50-c7f9-445a-91a0-ae4c0bbdff4d.htm
Attachments
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- Publication Document (Tender Document / Tender Notice)
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