Tenders Are Invited For Electron Microscopes - A Scanning Electron Microscope System With A Focused Ion Bundle For Sampling For Tomography Atomic Probe
Tenders Are Invited For Electron Microscopes - A Scanning Electron Microscope System With A Focused Ion Bundle For Sampling For Tomography Atomic Probe
Electron Microscopes - A Scanning Electron Microscope System With A Focused Ion Bundle For Sampling For Tomography Atomic Probe. The Subject Of The Contract Is The Supply Of An Electron Microscope With A Focused Ionic Volume (Fib-Sem) Including All Accessories, Installation, Software And Related Activities. The Subject Of Performance Of The Public Contract Is Detailed In Annex 1 To The Tender Documentation.
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