Tenders Are Invited For Modernization Of The Afm Microscope With Retrofitting In The Kelvin Probe

1. Modernization Of The Currently Owned Microscope Of The Nuclear Forces (Afm) Multimode With Nanoscope Iii To The Multimode 8-Hr Model With 6* Nanoścope Or Equivalent To: Replacement Of The Controller For The Nanoscope 6* Model Or Equivalent With Parameters: • Two Fast (50 Mhz), At Least 16-Bit Adc Transducers • Fast (10 Mhz), At Least 16-Bit Adc Converter For Data Acquisition For Intermittent Contact With Force Modulation, Contact Mode, Tunnel Scanning Microscopy And Electrical Modes With Adjustable Digital Filtering For Additional Speed Options/ Resolution • At Least Eight 20-Bit Adc Transducers With Medium Speed (500 Khz) • At Least Two Fast (50 Mhz) 16-Bit Dac Transducers • At Least Eight 16-Bit Dac Transducers With Medium Speed (2 Mhz) • 32 Bit Scanning In Three Axles With A Frequency Of At Least 2 Mhz Enabling Quick Scanning With The Highest Resolutions • Two Fast Lock-In Connectors (10 Hz Up To 10 Mhz) And One Average Speed (0.1 Hz To 50 Khz) Providing Broadband Resonance Modes • Resonance Mode • A New Dsp Card Dedicated To The Offered Control Of Electronic Components In The Database Of Your Multimode Microscope Necessary For Proper Communication With The Controller Model Nanoscope 6* Or Equivalent, Replacement Of The Camera For An Optical Preview With A Resolution Of Min. 5Mp Enabling Connection To The System Using A Usb Connector. The Conducted Modernization Of The Atomic Forces Microscope Should Ensure Compatibility With Modules Held By The Employer In The Form Of Tunnel Scanning Microscopy And For Nano Current Measurements As Well As A Scanner And Head. In Addition, The Ability To Work In The Following Modes And Parameters: Scan Speed To Min. 6Hz, Measuring Fashions: Contact, Intermittent Contact, Intermittent Contact With Force Modulation And Rapid Impact Of Strength To The Surface, The Possibility Of Making Mechanical Measurements Of The Sample Surface In The Form Of Force Curves And Determining The Parameters Of Elasticity Such As The Young Module. 2. Adding A Modernized Microscope Of The Atomic Forces In The Kelvin Probe Ensuring The Possibility Of Measurements In Kelvins Mode Microscopy Of Atomic Forces In Amplitude Fashion Enabling Work In Non -Contact Mode And Measuring The Difference In Potential Between The Tested Sample And The Probe. 3. Approval In A Module Enabling Work At High Speed Scanning. 4. The Control Unit (Computer) With A Monitor And Software Updated To The Latest Version Also Enabling Cooperation With The New Controller Nanoscope 6* Or Equivalent And Using The Module Enabling Work With A High Speed Of Surface Scanning As Well As A Scanning Assistant Mode, Which Optimizes Key Parameters Is Also Subject To The Latest Version. Microscope Operation, Thanks To Which It Improves The Work Of The Microscope Operator. 7. Minimum Take -Off 12 Months.