Tenders Are Invited For Electron Microscopes – Beam Aberration Corrector For Scanning Transmission Electron Microscopy

Electron Microscopes – Beam Aberration Corrector For Scanning Transmission Electron Microscopy. The Subject Of This Public Contract Is A Scanning Mode Electron Beam (Stem) Aberration Corrector To Achieve A Major Improvement In Point Resolution (Less Than 1 Angström) And Analytical Capabilities At Maximum Atomic Scale Microscope Magnifications, Which Will Upgrade The Existing Transmission Electron Microscope Tem Titan Themis 60- 300 (Installed In Clean Rooms (Iso 8) Ceitec Nano At But In Brno). Thanks To The Modernization Of The Microscope With An Electron Beam Aberration Corrector For Stem, It Will Be Possible To Perform Analyzes Of New Types Of (Nano)Materials That Cannot Be Performed On An Atomic Scale With The Current Microscope Due To Insufficient Point Resolution And/Or Sample Damage When High Accelerating Voltage Is Used. The Beam Aberration Corrector For Stem Will Be Used In The Research Of Advanced Materials For Future Technologies, It Will Also Make It Possible To Advance Current Knowledge In Microscopy Itself By Improving Methodologies Or Describing Phenomena Related To Advanced Corrected Microscopy. The Subject Of The Public Contract Is Defined In Detail By Technical, Commercial And Other Contractual Terms And Conditions, Which Are Part Of The Tender Documentation.