GTR 81088882
Tenders Are Invited For Scanning Electron Microscopes – Scanning Electron And Focussed Ion Beam Microscope (Fib-Sem)
ICB — International Competitive Bid
Closed
Western Europe
Tender Information
GTR Reference
81088882
Tendering Authority
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Tender No
327803-2024
Financer Name
Self-Funded
Work Title
Tenders Are Invited For Scanning Electron Microscopes – Scanning Electron And Focussed Ion Beam Microscope (Fib-Sem)
Bid Type
ICB — International Competitive Bid
Country
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Geographical Region
Western Europe
Last Date of Bid Submission
10-07-2024
Closed
Work Detail
Scanning Electron Microscopes – Scanning Electron And Focussed Ion Beam Microscope (Fib-Sem). A High-Performance Dual-Beam Device Consisting Of A Focussed Ion Beam (Gallium) And A Field Emission Scanning Electron Microscope. Applicable For A Wide Range Of Sample Preparation And Characterisation In The Micro And Nano Range. (For Details See Specification Documentation).
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Tender Value
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Global Tender Document
88575ffb-06c6-4eb5-886f-83400c73f6de.html
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