Tenders Are Invited For Focused Ion Beam-Scanning Electron Microscopes 1 Set

Tenders are invited for Focused Ion Beam-Scanning Electron Microscopes 1 Set Official in Charge of Disbursement of the Procuring Entity : Tsutomu Miyakawa, The Obligating Officer Director-General Administration Bureau, Nagoya Institute of Technology Classification of the Products to be Procured : 24 Nature and Quantity of the Products to be Purchased : Focused Ion Beam-Scanning Electron Microscopes 1 Set Delivery Period : By 28 February, 2025 Delivery Place : Nagoya Institute of Technology Qualifications for Participating in the Tendering Procedures : Suppliers Eligible for Participating in the Proposed Tender are Those Who shall : A not Come under Article 4 and 5 of the Regulation Concerning the Contract for Nagoya Institute of Technology, B have the Grade a, Grade B or Grade C Qualification during Fiscal 2024 in the TokaiHokuriku Area in Sales of Product for Participating in Tenders by Single Qualification for Every Ministry and Agency, C Prove to have Prepared a System to Provide Rapid after-Sale Service and Maintenance for the Procured Products, D not be Currently under a Suspension of Business Order as Instructed by the Obligating Officer Director-General. Time Limit of Tender : 17 : 00 5 July, 2024 Contact Point for the Notice : Sotaro Adachi, Accounting Division, Nagoya Institute of Technology, Gokiso-Cho Showa-Ku Nagoya-Shi 466-8555 Japan, Tel 052-735-5039 Please be Noted that if it is Indicated that Environmental Conditions Relating to the Procurement are Laid down in its Tender Documents. Tender Link : https://www.jetro.go.jp/en/database/procurement/national/articles/313527/2024051300420000.html