Tenders Are Invited For Laboratory, Optical And Precision Equipments (Excl. Glasses) – Röntgenphotoelektronenmikroskopie-System / Xps

Laboratory, Optical And Precision Equipments (Excl. Glasses) – Röntgenphotoelektronenmikroskopie-System / Xps. X-Ray Photoelectron Spectroscopy (Xps) System Specification Large Area Power Large Area Ag 3D5/2 Peak Resolution (Full Width At Half Maximum) Of 0.50 Ev With A Sensitivity Of 500,000 Cps, Of 0.60 Ev With 2,500,000 Cps Small Spot Power Specification Of The Device 15 Micron Ag 3D5/2 Peak Resolution (Full Width At Half Maximum) Of 0.50 Ev With A Sensitivity Of 1,500 Cps Charge Neutralizer Minimum Performance On Electrically Insulating Materials Using Only Low Energy Electrons, Measured On Polyethylene Terephthalate, Defined As Ester Peak Resolution (Fwhm). On Hydrocarbon Peak Sensitivity: Ester Peak Resolution (Full Width At Half Maximum) Of 0.70 Ev With A Sensitivity Of 20,000 Cps. Lateral Resolution In Xps Imaging Mode: Guaranteed Spatial Resolution In Imaging Mode 3 Microns Compatibility With The Leica Em Baf060 Freeze Fracture System + Leica Em Vct 100 Sample Cryotransfer System Or Offer A Comparable Compatible System Ion Source The Device Must Have A Source Of Monatomic Ar Ions In The Sample Analysis Chamber. Minimum Acceleration Range At Least 500 V To 4 Kv Handling Of The Sample Optical Camera In The Sample Receiving Chamber, Optical Microscope In The Sample Analysis Chamber Mind. 3 Sample Holders Can Be Loaded Into The Sample Receiving Chamber, Automatic Movement Into The P Analysis Chamber, Sample Holder In The P Analysis Chamber Can Be Automatically Exchanged For A Second Sample Holder In The P Input Chamber. Sample Attachment Minimum Sample Holder Area 2000 Mm2 Set Of Standard Samples Including: Cu; Ouch; Ag; Grid For Alignment And Faraday Cup Permanently In The P Analysis Chamber Sample Table With At Least 4 Electrical Connections Haxpes Monochromatic X-Ray Source With An X-Ray Line Energy Of More Than 2 Kv Switching Between Monochromatic Al X-Ray Source And High-Energy X-Ray Source Fully Automatic And Software-Controlled Ion Scattering Spectroscopy (Iss) With He Gas For Characterizing The First Atomic Layer Of Surfaces Auger Electron Spectroscopy (Aes) Heating And Cooling In The Sample Analysis Chamber 1 Site License For The Data Analysis Software, Which Can Be Used By Any Number Of Users At No Additional Cost. Remote Access Remote Operation And Error Diagnosis Requirements For Computer Hardware And Software According To Service Description Customer Service And Application Support Via Telephone/Remote/On-Site (English And German Hotline On Weekdays) Delivery, Introduction To The Target Laboratory, Assembly, Commissioning Training (In English) Completion Of All Agreed Service Elements (Delivery, Commissioning, Acceptance On Site, Training) And Final Invoice By June 2025 Documentation/Operating Manual In English Warranty At Least 2 Years Professional Dismantling And Disposal (Proof) Or Recycling (Only With The Consent Of The Client) Of The Existing Device (C332680/01 (2011) Kratos Analyti