GTR 77541890
Tenders Are Invited For Scanning Electron Microscopes – Focus Ion Beam Scanning Electron Microscope For Inspection And Edx Analysis Of 200Mm Wafers - Pr468071 -2390 - W
ICB — International Competitive Bid
Closed
Western Europe
Tender Information
GTR Reference
77541890
Tendering Authority
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Tender No
132385-2024
Financer Name
Self-Funded
Work Title
Tenders Are Invited For Scanning Electron Microscopes – Focus Ion Beam Scanning Electron Microscope For Inspection And Edx Analysis Of 200Mm Wafers - Pr468071 -2390 - W
Bid Type
ICB — International Competitive Bid
Country
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Geographical Region
Western Europe
Political Region
European Union,G20
Last Date of Bid Submission
03-04-2024
Closed
Work Detail
Scanning Electron Microscopes – Focus Ion Beam Scanning Electron Microscope For Inspection And Edx Analysis Of 200Mm Wafers - Pr468071 -2390 - W. Focus Ion Beam Scanning Electron Microscope For Inspection And Edx Analysis Of 200Mm Wafers - Pr468071 -2390 - W
Key Value
Tender Value
Ref. Document
Tender Documents
Global Tender Document
d0ec3faf-9e8c-47a0-aaa4-008e3f3c4dd8.html
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- Publication Document (Tender Document / Tender Notice)
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