Tenders Are Invited For Sensitive Materials Spherical Aberration Correction Transmission Electron Microscope And Focusing Ion Beam Electron Beam Double Beam Electron Microscope System(Rebidding)

Project Name: Sensitive materials spherical aberration correction transmission electron microscope and focusing ion beam electron beam double beam electron microscope system(Rebidding) Tenders are invited for 0801-244zj2440387, Sensitive Material Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System, 1 Set of Spherical Aberration Correction Transmission Electron Microscope for Sensitive Materials, 1 Set of Focusing Ion Beam Electron Beam Double Beam Electron Beam Electron Microscope System, 1 Set of Atomic Scale High Temperature and High Load in-Situ Study System for Transmission Electron Microscope, 1 Set of Three-Dimensional Reconstruction Frozen Transmission Sample Rod for Transmission Electron Microscope, 1 Set of Electron Back Scattering Diffraction (Ebsd) Detector, 1 Set of Active Shock Absorber for Transmission Electron Microscope for Sensitive Materials Spherical Aberration Correction Active Shock Absorber for Focusing Ion Beam Electron Beam Double Beam Electron Microscope System Products List: 1: Sensitive Materials Spherical Aberration Correction Transmission Electron Microscope and Focusing Ion Beam Electron Beam Double Beam Electron Microscope System Place of Implementation: Zhejiang Province, China Beginning of Selling Bidding Documents: 2024-02-19 Ending of Selling Bidding Documents: 2024-02-26 Price of Bidding Documents: 500/$80 Deadline for Submitting Bids/Time of Bid Opening (Beijing Time): 2024-03-12 09:00 Tender Link : https://www.chinabidding.com/en/detail/258992937-BidNoticeEn.html