Tenders Are Invited For Focused Ion Beam Scanning Electron Microscope (Sem-Fib)

Focused Ion Beam Scanning Electron Microscope (Sem-Fib). The Purpose Of This Award Procedure Is The Acquisition Of A Scanning Electron Microscope With Focused Ion Beam (Semfib) For Carrying Out High-Precision Electron Microscopy Studies, Ion Beam Structuring, Micro And Nanostructured Targets By Beam Lithography Of Electrons And High-Resolution X-Ray Spectroscopy Studies For The Characterization Of The Surfaces And The Elemental Composition (Including Contamination With Light Elements) Of The Materials And The Solid Targets Manufactured And Characterized In The Targets Laboratory For Experiments With High-Power Lasers. Pursuant To The Provisions Of Art. 160 Of Law No. 98/2016, With Subsequent Amendments And Additions, Interested Economic Operators Will Request Clarifications Or Additional Information In Relation To The Award Documentation Up To 20 Days Before The Deadline For Submission Of Offers. The Contracting Authority Will Respond Clearly And Completely To All Requests For Clarification/Additional Information Addressed By Economic Operators, On The 12Th Day Before The Deadline For Submission Of Offers, According To Art. 161 Of Law No. 98/2016, With Subsequent Amendments And Additions, In Conjunction With Art. 27 Paragraph (3) Of H.G. No. 395/2016 With Subsequent Amendments And Additions.