Tenders Are Invited For Ov_Lk_Two-Beam Scanning Microscope (Plasma Fib)

Ov_Lk_Two-Beam Scanning Microscope (Plasma Fib). As Part Of A Project Funded By The European Regional Development Fund, The Leibniz Institute For Crystal Growth In The Research Association Berlin E.V. Is Setting Up An Application Laboratory For In-Situ (Raster) Transmission Electron Microscopy ((S)Tem) In Order To Develop Materials For Use In Microelectronic, Optoelectronic And Power Components To Advance Lnsitu And Inoperando Techniques Have Established Themselves Internationally As The Key To The Further Development Of Materials And Components. For This Purpose, Conditions Are Created In The Sample Environment Of The Tem By External Stimuli To Which The Examined Sample Or The Component Is Exposed Under Real Conditions. In This Way, The Relevant Structural, Chemical, And Electronic Changes Can Be Visualized, Understood, And Manipulated On A Broad Scale Down To Individual Atoms In Situ And Inoperando. For The Reproducible Production Of Electron-Transparent Samples For In-Situ Transmission Electron Microscopy, A Two-Beam Scanning Microscope Is To Be Procured, Which Is Equipped With An Electron Column And An Ion Column For Nano-Processing Of Materials. In Order To Meet The High Demands On The Structural Perfection Of The Samples, Reproducibility And Throughput, As Well As The Wide Range Of Materials (Semiconductors, Dielectrics, Oxides, Nitrides, 2D Materials, Organic-Inorganic Heterostructures) And The Variety Of Applications (E.G. Sample Processing, 3D Sliceandview , Production Of Electronic Test Devices), A Plasma Fib Is Required That Uses Xenon, Argon, Oxygen And Nitrogen As The Primary Beam In The Same Ion Source. Compared To The Commonly Used Ga Sources, Such Plasma Sources Offer The Advantage Of Being Able To Select The Optimized Ion Source For The Respective Application (High Removal Or Low Damage) And The Respective Material And To Be Able To Change The Ion Type Within A Thinning Process. For Examining Surfaces And Nanostructures, The Electron Source Should Be Designed In Such A Way That A Spatial Resolution Of Less Than Or Equal To 1Nm Is Achieved For All Usable Acceleration Voltages. The Device To Be Procured Should Allow Automated Sample Processing And Programmable Workflows In Order To Develop Adapted Routines For A Wide Variety Of Applications And To Automate The Processes. The Research Data Is Structured According To The Fair Principles (Findable, Accessible, Interoperable, Reusable) In Order To Evaluate And Process It With Ai-Based Tools. The Device Is To Be Used As Part Of An Open Laboratory Concept In Which Researchers Use It Under Supervision. The Contractor Must Deliver The System To The Place Of Use In The Physics Building Of The Humboldt University In Berlin In Adlershof (Room 0.512), Newtonstrasse 15, 12489 Berlin, Where It Must Be Completely Installed And Put Into Operation. An On-Site Inspection Of The Premises By The Bidder Is Required Prior To Bidding. The Room Dimensions Are To Be Recorded And Possible Magnetic Fields, Acoustic Signals And Floor Vibrations Are To Be Detected, Which Can Have A Negative Effect On The Performance. The Results Are To Be Enclosed With The Offer. The Scope Of Services Also Includes: Announcement In The Offer Of The Dimensions And The Respective Weight Of The Individual Microscope Parts, The Provision Of A Complete User Manual In English In Electronic Form, Implementation Of A Training (5 Days Á 8H).