Tenders are invited for In Situ Micronano Thermal Analysis Focused Ion/Electron Beam Scanning Electron Microscopy At Shanghai Jiao Tong University

Project Name: In Situ Micronano Thermal Analysis Focused Ion/Electron Beam Scanning Electron Microscopy At Shanghai Jiao Tong University Tenders Are Invited For The Equipment For The Integration Of The Fib - Sem Double Beam Electron System, Can Be Used In The Microscopic Characterization And Processing Of Materials, Such As Morphology Characterization, Elemental Analysis, Section Samples And Fixed-Point Tem Sample Preparation, 3 D Analysis And So On. Products List: 1: In Situ Micronano Thermal Analysis Focused Ion/Electron Beam Scanning Electron Microscopy At Shanghai Jiao Tong University Place Of Implementation: Shanghai Beginning Of Selling Bidding Documents: 2022-11-25 Ending Of Selling Bidding Documents: 2022-12-02 Price Of Bidding Documents: 500/$75 Deadline For Submitting Bids/Time Of Bid Opening (Beijing Time): 2022-12-27 13:30 Tender Link : Https://Www.Chinabidding.Com/En/Detail/254070079-Bidnoticeen.Html