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    • Tenders Are Invited For Dual Beam Focused Ion Beam / Scanning Electron Microscope System

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    54889371
    You can view only after subscription.
    1333ND22QNB640507
    Self-Funded
    Tenders Are Invited For Dual Beam Focused Ion Beam / Scanning Electron Microscope System
    ICB
    You can view only after subscription.
    Northern America
    Asia-Pacific Economic Cooperation, APEC,APAC ( Asia Pacific)
    14-09-2022

    Work Detail

    Dual Beam Focused Ion Beam / Scanning Electron Microscope System/Rnaics Code: 334516 - Analytical Laboratory Instrument Manufacturing/R Product Service Code: 6640 - Laboratory Equipment And Supplies

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