Diffraction ApparatusX Ray Diffractometer With High Temperature ChamberDescription The X Ray Diffractometer With High Temperature Chamber Ht Xrd Advertised Here Is Intended To Serve As Part Of The Research Program Of The Center For Efficient High Temperature Substance Conversion Zehs For The Temperature Dependent Structural And Morphological Characterization Of Crystalline And Amorphous Materials For High Temperature Applications Time Limit For Receipt Of Tenders Or Requests To Participate Date 31 03 2020 Local Time 11 00 Disclaimer The Above Text Is Machine Translated For Accurate Information Kindly Refer The Original Document
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