Tenders Are Invited For Scanning Electron Microscopes – The Procurement Of The Supply, Installation And Commissioning Of A Focused Ion Beam Scanning Electron Microscope (Fib-Sem) With Gallium Ion Source

Scanning Electron Microscopes – The Procurement Of The Supply, Installation And Commissioning Of A Focused Ion Beam Scanning Electron Microscope (Fib-Sem) With Gallium Ion Source. Dtu Requires The Supply, Delivery, Installation, Commissioning And Acceptance Of One (1) Focused Ion Beam Scanning Electron Microscope (Fib-Sem) Dual-Beam Platform. The Instrument Shall Serve A Multi-User Research Environment And Will Be Used For High-Resolution Surface Imaging, Site-Specific Cross-Sectioning, Tem Lamella Preparation (Including Automated Workflows), 3D Fib-Sem Tomography, Gas-Assisted Deposition And Etching, Nanoscale Manipulation, And Elemental Microanalysis By Energy-Dispersive X-Ray Spectroscopy (Eds) And Tof-Sims.