Tenders Are Invited For Machines And Apparatus For Testing And Measuring – Integrated System For Electric Characterization And Probing Of Semiconductor Components And Neuromorphic Electronics

Machines And Apparatus For Testing And Measuring – Integrated System For Electric Characterization And Probing Of Semiconductor Components And Neuromorphic Electronics. The University Of Oslo Is Establishing A New Research Environment In Neuromorphic Hardware For Energy-Efficient Artificial Intelligence. The Activity Will Connect Materials Development At The Centre For Materials Science And Nanotechnology (Smn) With Expertise In Circuit And System Design At The Department Of Informatics. A Central Need Is The Ability To Electrically Characterize Devices From Early-Stage Materials And Device Development To Small Arrays And Demonstrators. This Includes Ferroelectric Tunnel Junctions (Ftjs), Ferroelectric Field-Effect Transistors (Fefets), Resistive Memory Devices, And Other Device Concepts Relevant To Neuromorphic Electronics. The Requirement Consists Of Two Technical Main Parts (Lot 1 And Lot 2): 1: A Modular Electrical Measurement And Characterization Device 2: A Semi‑Automatic Probe Station With Temperature Control