Tenders Are Invited For Scanning Probe Microscopes – Dfg Large-Scale Atomic Force Microscope

Scanning Probe Microscopes – Dfg Large-Scale Atomic Force Microscope. The System Is Intended To Be Used For High-Resolution Surface Characterization As Well As For Quantitative Investigations Of The Mechanical, Adhesive, Tribological And Electrical Properties Of Particles, Fibers, Membranes, Coated Surfaces And Biological Samples. Of Particular Importance Are Force Spectroscopy, Local Nanomechanics, Adhesion And Friction Measurements As Well As Investigations Of Individual Cells And Particles In Liquids. The Measurement Data Will Be Used, Among Other Things, To Parameterize And Validate Physical Contact, Adhesion And Deformation Models As Well As To Model Particulate Systems. For Requirements See Service Description And Evaluation Matrix.