GTR 118076264
Tenders Are Invited For Power Semiconductor Device Dynamic Parameter Tester Procurement Project Of Institute Of Electrical Engineering, Chinese Academy Of Sciences (Second)
ICB — International Competitive Bid
Closed
Eastern Asia
Tender Information
GTR Reference
118076264
Tendering Authority
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Tender No
OITC-G260172054-1
Financer Name
Self-Funded
Work Title
Tenders Are Invited For Power Semiconductor Device Dynamic Parameter Tester Procurement Project Of Institute Of Electrical Engineering, Chinese Academy Of Sciences (Second)
Bid Type
ICB — International Competitive Bid
Country
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Geographical Region
Eastern Asia
Political Region
Asia-Pacific Economic Cooperation, APEC,BRIC,G20,APAC (Asia Pacific)
Last Date of Bid Submission
09-10-2026
Closed
Work Detail
Public Bidding Announcement For The Power Semiconductor Device Dynamic Parameter Tester Procurement Project (Second) Of The Institute Of Electrical Engineering, Chinese Academy Of Sciences
Key Value
Tender Value
Ref. Document
Tender Documents
Global Tender Document
9876a98c-a12b-46fd-a7e7-fb42d0b09b6c.html
Attachments
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- Publication Document (Tender Document / Tender Notice)
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