Tenders Are Invited For Diffraction Apparatus – X-Ray Diffraction Equipment

Diffraction Apparatus – X-Ray Diffraction Equipment. X-Ray Diffraction Equipment, Intended For The Non-Destructive Characterization Of Synthesized Materials, In Order To Determine The Crystalline Structure And Microstructural Parameters. It Will Enable The Analysis Of A Wide Range Of Materials (Thin Films, Powders, Liquid Suspensions, Membranes), Being Used For Applications Such As Phase Identification And Analysis, Rietveld Refinement, Microstructural Analysis, Reflectivity Measurements, Reciprocal Space Mapping And Residual Stress Determination. The Equipment Will Be Part Of A Prototyping Line Of The Microfabrication Of Semiconductor Devices Type, Within The Pnts Project - National Semiconductor Technologies Platform. The Equipment Must Provide High-Resolution Measurements, Flexibility In Experimental Setup, And Be Equipped With Detection Systems, Analysis Software, And Safe Operating Mechanisms.