Tenders Are Invited For Laboratory, Optical And Precision Equipments (Excl. Glasses) – Semi Automatic Prober For Characterization Of 200 Mm Wafers

Laboratory, Optical And Precision Equipments (Excl. Glasses) – Semi Automatic Prober For Characterization Of 200 Mm Wafers. The Subject Of The Procurement Is The Delivery Of An Operational, Semi-Automatic Wafer Probe System With An Integrated Characterization System. The Entire System Must Be Suitable For Dc-I/V, C-V, C-F, C-T And Low-Frequency Impedance Measurements Up To 10 Mhz And Must Be Delivered, Installed, Commissioned And Handed Over As A Fully Integrated Unit, Including User Training. All Interfaces Between The System Components Must Be Ensured By The Contractor.