Tenders Are Invited For Scanning Electron Microscopes – Upol/Přf/Kef - Fib-Sem System Including Analytical Techniques And Nanoindentation

Scanning Electron Microscopes – Upol/Přf/Kef - Fib-Sem System Including Analytical Techniques And Nanoindentation. The Subject Of The Public Contract Is The Supply Of A Microscopic System Fib-Sem (Scanning Electron Microscope With An Ion Beam) With The Possibility Of Deposition Of At Least Three Materials (Platinum, Carbon, Tungsten) And With Subsequent Analytical Techniques For Detailed Analysis Of The Studied Materials (4Dstem, Ebsd, Eds, Nanoindentation, Tof-Sims). The Minimum Requirements For The Subject Of Public Procurement Are Defined By Technical, Commercial Or Other Contractual Conditions, Which Are Attached To The Tender Documentation. In Particular, The Technical Specification And The Binding Text Of The Contract.