Tenders Are Invited For Checking And Testing Apparatus – Procurement Of A Convertible Wafer Prober For 200 Mm Wafers With Compatibility With The Advantest V93000 Exa Scale Test System

Checking And Testing Apparatus – Procurement Of A Convertible Wafer Prober For 200 Mm Wafers With Compatibility With The Advantest V93000 Exa Scale Test System. The Subject Of The Procurement Is An Automatic Wafer Sampler For Processing 200 Mm Wafers. The Wafer Prober Must Be Compatible With The Clients Existing Advantest V93000 Exa Scale Test System. Due To The Existing Measurement And Test Infrastructure, The System Must Have Both A 9.5 Pogo Tower Docking Interface And A Direct Docking Interface. For Different Applications, Both Cantilever Probe Cards In 9.5 Pogo Tower Operation And Direct Docking Configurations For High-Performance Applications Are Used. Therefore, The Wafer Prober Must Be Convertible Between Both Docking Configurations. For Detailed Minimum Technical Requirements, See The Technical Specification Document