Tenders Are Invited For Instruments For Measuring Electrical Quantities – 200 Mm Semi-Automatic Rf Probe System For On-Wafer Measurements Up To 250 Ghz

Instruments For Measuring Electrical Quantities – 200 Mm Semi-Automatic Rf Probe System For On-Wafer Measurements Up To 250 Ghz. - Semi-Automated 200 Mm Probe System For On-Wafer Measurements - Integrated Controlled Dry Atmosphere To Prevent Condensation And Ice Formation During Measurements Below Ambient Temperature - System Design With A Defined Interface Architecture Enabling Integration Of Optional Thermal Chucks Through Standardized Mechanical, Electrical, And Software Interfaces - Automatic Wafer Size Recognition (150 Mm, 200 Mm Wafers And Individual Dies Down To 5 × 5 Mm) - Precision Xy Stage: Minimum Travel Range 310 × 310 Mm, Repeatability < 1.0 Μm, Accuracy < 2.0 Μm - Precision Z Stage: Minimum Travel Range 30 Mm, Repeatability < 1.0 Μm, Accuracy < 2.0 Μm - Theta Axis: ±5°, Resolution ? 0.0001° - Controlled Contact Mechanism With Repeatability ? 1 Μm - Integrated Vibration Isolation And Leveling Table - Central Operator Console For Control Of All Axes And System Functions - Integrated Keyboard And Mouse Tray - Power Supply: 100-240 V Ac, 50/60 Hz