Tenders Are Invited For Instruments For Measuring Electrical Quantities – 300 Mm Semi-Automatic Rf Probe System For On-Wafer Measurements Up To 250 Ghz

Instruments For Measuring Electrical Quantities – 300 Mm Semi-Automatic Rf Probe System For On-Wafer Measurements Up To 250 Ghz. Semi-Automatic 300 Mm Hf Measuring System With Controlled Dry Atmosphere - Semi-Automatic 300 Mm Probe System For On-Wafer Measurements - Integrated Controlled Dry Atmosphere To Avoid Condensation And Ice Formation When Measuring Below Ambient Temperature - System Design With Defined Interface Architecture For Integration Of Optional Thermal Chucks (Thermal Chuck) Via Standardized Mechanical, Electrical And Software Interfaces - Automatic Detection Of Wafer Sizes (150 Mm, 200 Mm, 300 Mm And Individual Chips Up To 5 × 5 Mm) - Precision Xy Table: At Least 310 × 310 Mm Travel Range, Repeatability < 1.0 Μm, Accuracy < 2.0 Μm - Precision Z-Table: At Least 30 Mm Travel Range, Repeatability < 1.0 Μm, Accuracy < 2.0 Μm - Theta Axis: ±5°, Resolution ? 0.0001° - Controlled Contact Mechanism With ? 1 Μm Repeatability - Integrated Vibration Isolation And Leveling Table - Central Control Console For Controlling All Axes And Functions - Integrated Keyboard And Mouse Tray - Power Supply 100-240 V Ac, 50/60 Hz