Tenders Are Invited For Electron Backscatter Diffraction Detector For Focused Ion Beam Microscope (2)

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113710978
0729-264OIT321016/02
Self-Funded
Tenders Are Invited For Electron Backscatter Diffraction Detector For Focused Ion Beam Microscope (2)
NCB
Eastern Asia
Asia-Pacific Economic Cooperation, APEC,BRIC,G20,APAC (Asia Pacific)
18-06-2026

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Electron Backscatter Diffraction Detector for Focused Ion Beam Microscope

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