GTR 113294623
Tenders Are Invited For Scanning Electron Microscopes – Supply Of Double Beam Electron Microscope With Ebsd Detector And Electron Nanolithography (Ebl) And Focused Ion (Fib) Systems
ICB — International Competitive Bid
Closed
Southern Europe
Tender Information
GTR Reference
113294623
Tendering Authority
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Tender No
342007-2026
Financer Name
Self-Funded
Work Title
Tenders Are Invited For Scanning Electron Microscopes – Supply Of Double Beam Electron Microscope With Ebsd Detector And Electron Nanolithography (Ebl) And Focused Ion (Fib) Systems
Bid Type
ICB — International Competitive Bid
Country
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Geographical Region
Southern Europe
Political Region
European Union
Last Date of Bid Submission
02-06-2026
Closed
Work Detail
Scanning Electron Microscopes – Supply Of Double Beam Electron Microscope With Ebsd Detector And Electron Nanolithography (Ebl) And Focused Ion (Fib) Systems. Supply Of Double Beam Electron Microscope With Ebsd Detector And Electronic Nanolithography (Ebl) And Focused Ion (Fib) Systems For The Nanotechnology Unit Of The Scientific-Technical Services Of The University Of Oviedo
Key Value
Tender Value
932,397 - EUR
Tender Documents
Global Tender Document
99fc0206-2b05-478f-9198-a263e92142b4.html
Attachments
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- Tendering Authority
- Publication Document (Tender Document / Tender Notice)
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