Tenders Are Invited For Laboratory, Optical And Precision Equipments (Excl. Glasses) – Nano-Indenter For Dynamic Nanoscale Testing Including Continuous Stiffness Measurements, In-Situ Scanning Probe Microscopy, And High-Speed Mechanical Microscopy
Tenders Are Invited For Laboratory, Optical And Precision Equipments (Excl. Glasses) – Nano-Indenter For Dynamic Nanoscale Testing Including Continuous Stiffness Measurements, In-Situ Scanning Probe Microscopy, And High-Speed Mechanical Microscopy
Laboratory, Optical And Precision Equipments (Excl. Glasses) – Nano-Indenter For Dynamic Nanoscale Testing Including Continuous Stiffness Measurements, In-Situ Scanning Probe Microscopy, And High-Speed Mechanical Microscopy. The Nanoindentation System Shall Support The Investigation Of Ion Radiation Induced Damage And Other Degradation In Metals, Ceramics, Claddings, Protective Coatings And Thin Films. The System Shall Enable High Resolution Nanoindentation Using Both Quasi Static And Dynamic Measurement Techniques, In-Situ Scanning Probe Microscopy, And High-Speed Mechanical Property Mapping (I.E., Mechanical Microscopy), Thereby Allowing Precise Probing Of Damage Gradients And Other Microstructural Features.
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