GTR 111814145
Tenders Are Invited For Large Area Avalanche Photodiode Array For High Signal Swir Applications
ICB — International Competitive Bid
Closed
Western Europe
Tender Information
GTR Reference
111814145
Tendering Authority
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Tender No
1-13353
Financer Name
Self-Funded
Work Title
Tenders Are Invited For Large Area Avalanche Photodiode Array For High Signal Swir Applications
Bid Type
ICB — International Competitive Bid
Country
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Geographical Region
Western Europe
Political Region
European Union
Last Date of Bid Submission
12-06-2026
Closed
Work Detail
Tenders are Invited for Large Area Avalanche Photodiode Array for High Signal SWIR Applications - Expro plus. Objective: To develop prototype Avalanche Photodiode (APD) structures in an Mercury-Cadmium-Telluride (MCT) detection layer for high flux Earth Observation applications. Description: Hybrid infrared detectors, using a silicon Readout Integrated Circuit (ROIC) and Mercury-Cadmium-Telluride (MCT) detection layer, are the gold standard for high performance optical systems in space. Recent demonstrations of Avalanche Photodiode (APD) technology in MCT layers opens up the possibility of signal magnification at the pixel level which reduces the effective readout noise. This can unlock performance improvements through an enhanced Signal-to-Noise ratio (SNR),or allow operation at equivalent SNR but with faster frame rates (reducing ground sampling distances, or allowing higher operating temperatures). Prototype APD structures in MCT material shall be designed and manufactured, and coupled to a high performance readout circuit suited for Earth Observation applications. Detailed electro-optic characterisation shall be performed, to compare to equivalent detectors manufactured with a standard MCT technology. The advantage/disadvantages of the technology shall be assessed for a range of EO applications. This activity encompasses the following tasks: - Expected performance simulation for an Earth Observation ROIC operated with an APD detection layer - Design and manufacture of test samples with APD designs - Characterisation of device performance - Critical assessment of test results, including comparison to performance simulation and design expectations. Price Range: 500 KEURO Open Date: 15/04/2026 10:22 CET Closing Date: 12/06/2026 13:00 CET Tender Link : https://esastar-publication-ext.sso.esa.int/ESATenderActions/filter/open
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