Tenders Are Invited For Scanning Electron Microscopes – Plasma Fib/Sem For Room-Temperature And Cryogenic Applications

Scanning Electron Microscopes – Plasma Fib/Sem For Room-Temperature And Cryogenic Applications. The New Plasma-Focused Ion Beam/Scanning Electron Microscope To Be Offered Will Be Shared For Applications Under Cryogenic (Frozen Biological Materials And Battery Materials) As Well As Under Room Temperature Conditions (All Types Of Materials). Therefore, It Must Be Fully Room Temperature As Well As Cryo-Compatible And Also Allow For Vacuum/Inert Gas Transfer. Its Main Applications Will Be The Preparation Of Tem Lamellae And Of Pillars For X-Ray Investigations At The Synchrotron. Material Investigations (Sem Imaging; Fib Cross-Sections), 3D Fib Tomography And Prototyping Will Be Additional Important Topics. A Fluorescence Light Microscope And Energy Dispersive X-Ray Spectroscopy Will Complement The Capabilities Of The Instrument.