Tenders Are Invited For Instruments For Measuring Electrical Quantities – High Magnetic Field Characterization Station

Instruments For Measuring Electrical Quantities – High Magnetic Field Characterization Station. Equipment Called High Magnetic Field Characterization Station; More Specifically A Cryogenic Equipment For The Electrical Characterization/Testing Of Devices, At High And Low Frequencies, And In The Presence Of A Magnetic Field. The Equipment Will Be Used - Together With An Existing Vector Network Analyzer (Vna) - For Measuring S-Parameters In The Microwave And Millimeter Wave Range (Up To 67 Ghz), As Well As For Direct Current And Low-Frequency Measurement Of Active And Passive Devices, In High Magnetic Field And In A Very Wide Temperature Range (From Cryogenic Temperatures To 400 K). Within The Project Financing The Purchase, The Equipment To Be Purchased Will Be Integrated Into The Pilot Line For Standard Microfabrication Of Semiconductor Devices, The Development Direction Related To Devices And Systems Operating At High Frequencies (Ghz). The Equipment Is Configured Based On Specifications Provided In The Specifications, Which Are Accepted As Specific Requirements For The Characterization Of Devices And Circuits Developed In The Current Technology Of The Semiconductor Industry. The Functional Characterization Of Any Device Or Circuit Operating At High Frequencies, In The Absence Or Presence Of A Magnetic Field, Is Imperative For The Validation Of Design Models, Technological Processes Related To The Manufacturing Chain As Well As For The Development Of Systems And Applications. The Equipment To Be Purchased Will Be Used Exclusively For Research Purposes, For Evaluating Device Performance Parameters And Validating Circuits For Various Applications.