Bids Are Invited For Electrical Testing Systems

The Nanofab Centre At The University Of Alberta Requires An Electrical Testing System For High-Performance, High-Throughput Measurements Of Radio-Frequency And Microwave Devices With Easy Operation Suitable For A Core Facility Environment. The Tool Set Shall Provide High-Performance Measurement Through Both A Vector Network Analyzer (Vna) And An Accompanying Digital Oscilloscope. The Tools Shall Be Capable Of Providing Single- And Multiport Measurements Of Intermodal Distortion (Imd), Third-Order Intercepts (Toi), And Noise Figures (Nf) That Are Needed For The Development And Characterization Of Switches, Planar Rf Waveguides, Microwave Switches, And Directional Couplers.