Scanning Probe Microscopes – Delivery Of An Atomic Force Microscope Enabling Automatic Measurements. The Subject Of The Order Is An Atomic Force Microscope (Afm) Set Enabling The Measurement Of Topography And Other Properties Of Substrates And Epitaxial Layers Of Semiconductor Structures, In Particular Those Manufactured Using The Mbe Method On Gan Substrates, Consisting Of: 1) Independent Scanners In The Z And Xy Axis, With The Z Axis Scanner Being Integrated In The Microscope Head, And The Xy Scanner Is An Element Of The Scanning Table. 2) An Automated Table Enabling Measurements Of Substrates With A Diameter Of 2, As Well As Measurements Of Smaller Samples. 3) An Optical Set For Previewing The Sample 4) An Electronic, Digital Microscope Controller 5) A Sound-Absorbing Chamber And An Active Anti-Vibration Platform. 6) A Computer Set A Detailed Description Of The Subject Of The Order Can Be Found In Point 3 Of The Swz
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