Expression of Interest For Electron Backscatter Diffraction Detector On The Existing Scanning Electron Microscope

Expression of Interest for Electron Backscatter Diffraction Detector on the Existing Scanning Electron Microscope (Sem) in the Mcl Laboratory Requests within recent and ongoing projects highlighted the relevance of electron backscatter diffraction (EBSD) and transmission Kikuchi diffraction (TKD) beyond anticipated needs: Open Access (JAMMED, CRAFT, 3DPIMEA, CANMECH, NIFEM, SAHARA and CHRONIC), Exploratory Research (ULTIMATE and DICTION), competitive projects (NUCOBAM, INNUMAT), in addition to institutional activities (SMARTI). The first reason is the trend towards increased variety in materials investigated prompted by open-access and competitive projects, compared to institutional activities for which the existing SEM and PFIB combination has been configured for, particularly in projects where the synergies with G.I.4 activities are on methodology developments rather than on the case study. The second reason is a growing interest in EBSD and TKD in general, triggered by recent major improvements in detector sensitivity and, specifically within the frame of the present procurement, indexation methods. The result was/will be the saturation of the availability of the EBSD system on the Plasma focused ion beam - scanning electron microscopy PFIB-SEM. The EBSD detector on the PFIB-SEM is geared towards 3-D imaging and sample preparation for cases where standard polishing and etching methods produce artefacts, which is not needed for most screening analyses. Further, the PFIB-SEM is a heavily used and advanced instrument (often running overnight and during week-ends using automation and further periodic downtimes for maintenance), procured primarily for specific tasks, including micro-fabrication, 3-D imaging, lamella preparation and high-resolution imaging of ion-polished cross-sections. Therefore, screening and specific 2-D high-resolution EBSD measurements block the PFIB-SEM and affect its availability for fulfilling its primary purpose. The proposed solution is the procurement and installation of a high-throughput capable EBSD system on the SEM. Benefits are anticipated on several fronts. First, the pressure on the PFIB-SEM for tasks outside its main purpose will be reduced. Second, visiting scientists can operate the SEM after adequate training, which is not feasible with the PFIB-SEM because of its use case at G.I.4 (prototyping and 3-D measurements campaigns over several weeks) and higher complexity and maintenance needs. Tender Link : https://ec.europa.eu/info/funding-tenders/opportunities/portal/screen/opportunities/tender-details/3b2cc143-40d3-444f-975a-521e2af975f6-EXA

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