Request For Proposals Are Invited For Digital Referencing And Analysis Of Seals Optical Profilometer Deadline 13 Apr 2022 17 00 Gmt 2 00 Brussels Copenhagen Madrid ParisScopeThis Specification Describes The Requirements For An Optical Profilometer That Will Be Used For Referencing Quality Control And Forensic Analysis Of Sealing Equipment Hereinafter Referred To As The Profilometer To Be Used In The Seals Laboratory At The International Atomic Energy Agency The Iaea Headquarters In Vienna Austria Alternatively Referred To Hereinafter As The Site And The End User The Profilometer Shall Automatically Scan A Tray Of Seals To Record With High Level Of Detail Engraved Patterns On Them For Later Comparison After The Seal Has Been Fielded The Profilometer Shall Include The Relevant Analysis Software To Aid In Comparing Scanned Seals 2 Definitions Acronyms And Abbreviations The Following Definitions Acronyms And Abbreviations Shall Apply Throughout This Specification Unless Defined Otherwise Hereinafter Fvps Field Verifiable Passive Seal X Y Z Cartesian Coordinates Z Perpendicular To A Surface
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